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| ====Integrated Test Plan==== | | ====Integrated Test Plan==== |
| *includes design baseline evaluation | | *includes design baseline evaluation |
− | *# critical design parameters | + | *# identifying critical design parameters |
− | *# performance threshholds | + | *# setting performance threshholds |
| *individual Subsystems test plans | | *individual Subsystems test plans |
− | *# suitability tests | + | *# functional tests |
| *# effectiveness tests | | *# effectiveness tests |
| *platform performance test plan | | *platform performance test plan |
| *# MOE (measures of effectiveness) | | *# MOE (measures of effectiveness) |
− | *#* maximum operational time | + | *#* maximum time on range without operation intervention |
− | *#* operational goal accomplishment | + | *#* hardware operational goal accomplishment |
− | *# MOS (measures of suitability) | + | *#* AI operational goal accomplishment |
− | *#*subsystem Interoperability | + | *# MOF (measures of functionality) |
− | *#*mean time between operational failure | + | *#*subsystems Interoperability |
| + | *#*mean time between Interoperability failure |
| | | |
| ==Core Competency== | | ==Core Competency== |